Images and diffraction patterns are available here.
Information are given in the
test.txt file. Kikuchi pattern, diffraction patterns and a series of bright field images can be used to test kikuchi, diffraction and interface.
Transmission Electron Microscopy, by D. Williams and C.B. Carter link
Transmission Electron Microscopy, by L. Reimer link
Defect analysis in Electron Microscopy, by M. H. Loretto and I. Smallmann
Practical Electron Microscopy in Materials Science, by J.W. Edington