Further ressources

Running tests

Images and diffraction patterns are available here.

Information are given in the test.txt file. Kikuchi pattern, diffraction patterns and a series of bright field images can be used to test kikuchi, diffraction and interface.

References

General

  • Transmission Electron Microscopy, by D. Williams and C.B. Carter link

  • Transmission Electron Microscopy, by L. Reimer link

  • Defect analysis in Electron Microscopy, by M. H. Loretto and I. Smallmann

  • Practical Electron Microscopy in Materials Science, by J.W. Edington