Further ressources
Running tests
Images and diffraction patterns are available here.
Information are given in the test.txt
file. Kikuchi pattern, diffraction patterns and a series of bright field images can be used to test kikuchi, diffraction and interface.
References
General
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Transmission Electron Microscopy, by D. Williams and C.B. Carter link
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Transmission Electron Microscopy, by L. Reimer link
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Defect analysis in Electron Microscopy, by M. H. Loretto and I. Smallmann
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Practical Electron Microscopy in Materials Science, by J.W. Edington